Description

Combined Hardness Tester NOVOTEST T-UD3 combines two methods of measuring hardness by an indirect method: Ultrasonic Contact Impedance (ASTM A1038) and Leeb (ASTM A956). This makes the device the most versatile portable device in the world.
The ability to connect both probes combine the advantages of both methods and providing users the opportunity to use the one that is most suitable for solving a specific task. The Combined Hardness Tester NOVOTEST T-UD3 allows user to measure the hardness of any metals, parts of any shape and thickness, measure the hardness of the surface hardened layers and evaluate the tensile strength.

Features

o    Small indenter imprint (suits for mirror surfaces of shafts necks, blades, gear teeth, etc.)
o    Measuring surface hardened layers hardness
o    Wide range of hardness testing
o    Various measurement modes
o    88 combinations of materials and hardness scales (calibrations)
o    Calibration of any scale in any range
o    Convenience and ease of measurement
o    Optimized number of buttons
o    Large full-color graphic display with bright backlight
o    Built-in photo camera for thorough reports
o    Automatic probe types recognition
o    Connected probe types indication
o    The calibrations are stored in UCI probe memory
o    Extended operating temperature range (frost, down to – 40°C)
o    Internal memory and communication with a PC
o    New intuitive menu with tips on the buttons
o    Optional wireless mini printer
o    Waterproofed housing
o    Rubber bumper protected housing
o    Internal clock
o    Hardness value measuring for any mass products with more than 1 mm thickness (small parts, thin-walled structures, pipes, tanks, steel sheets, articles of complex shape, hardness testing of metal coatings, etc.)
o    Different operating modes:
o    Graph – the graph building mode
o    Histogram – the histogram building mode
o    Statistics – provides statistics for the current set of measurements
o    Smart – filters the incorrect measurements
o    Signal – displays the probe signal (only for the Leeb probe)

Specifications: